Pickering Interfaces will present its modular signal switching and sensor simulation solutions for automotive electronics testing at Automotive Testing Expo North America 2025, held October 21st to 23rd at Suburban Collection Showplace in Novi, Michigan (Booth 9003).
The company will also debut new MEMS-based MultiGBASE-T1 fault insertion units (FIUs) for high-speed automotive Ethernet applications.
The event brings together technologies for ADAS, autonomous systems, and electric vehicle (EV) and hybrid powertrain testing, as well as aerodynamics, EMI, NVH, and environmental testing. With more than 250 exhibitors, the show is recognized as a key venue for advancements in vehicle, component, and system validation.
Pickering will feature a hardware-in-the-loop (HIL) battery management system (BMS) testing demonstration, highlighting how modular PXI platforms can simulate real-world conditions for EV battery systems. The setup includes battery simulator modules for stacked architectures, fault insertion modules to replicate shorts and wiring issues, and high-power switching modules housed in LXI chassis for remote operation.
The company will also display new 5-amp battery simulator modules and other high-power PXI switching systems for EV and electronic system validation, together with supporting cabling solutions and its graphical Cable Design Tool.
Pickering’s solutions are used across vehicle development programs to accelerate test automation and improve reliability in both electric and conventional platforms.
Filed Under: Technology News, Test And Measurement