The UT Dallas technology works by sensing conditions such as input voltage and load current that can indicate increased EMI in power circuits. In response, the technology applies on-chip countermeasures to bring EMI back under control. Ma compared the tool to a test that determines indicators of high blood glucose.

In 2022 Du received the IEEE Charitat Award (Young Researcher Award) at the 34th International Symposium on Power Semiconductor Devices and ICs for separate technology to detect aging of integrated circuits brought on by stress or heat. That sensor is the first to be able to test aging inside a computer chip and in its casing. The award is presented to a young researcher who is the first author and presenter of a paper determined to be the best overall among all eligible papers.