Pickering Interfaces has introduced the 60-107-001, a compact 12-slot LXI and USB modular chassis for PXI and PXIe modules.
The chassis supports high-density automated test systems used in sectors, such as electric vehicle (EV) development, automotive electronics, aerospace, and semiconductor verification. Its 12 hybrid-compatible slots in a 2U form factor give engineers a way to consolidate switching, simulation, and instrumentation resources in limited rack space.
The chassis includes a fully hybrid PXI and PXIe backplane and can be controlled through Gigabit Ethernet or USB 3.0. This enables system control through standard PC interfaces without a dedicated PXI controller or embedded PC. The horizontal module orientation and removal of the traditional system slot allow the full 12 slots to be used for instrumentation, including modules up to four slots wide.
A transverse cooling system moves airflow across the chassis, which removes the usual requirement for an empty rack space above or below the unit. This allows a second chassis to be mounted directly above, supporting up to 24 modules in 4U of rack height. This configuration gives higher density than previous generation systems in comparable space.
The 60-107 series includes field-replaceable modules for the power supply and embedded controller. These can be accessed from the rear without removing the chassis from the rack, simplifying service and future upgrades. The front panel includes OLED displays that report LAN status and IP addressing, and an automatic fan control system adjusts airflow based on thermal load.
For applications that require repetitive switch and measure operations, a variant of the chassis, the 60-107-002, includes built-in scan list sequencing and triggering to help reduce system latency during automated test cycles.
Pickering notes that the design supports expanding existing PXI-based test systems where additional density is needed for switching, sensor simulation, or instrumentation.
Filed Under: Technology News, Test And Measurement, Testing and Safety