Keysight Technologies has developed an optically isolated differential probing family dedicated to enhancing the efficiency and performance testing of fast-switching devices such as wide bandgap GaN and SiC semiconductors.
This technology will drive progress in efficiency and switching loss testing for high-voltage applications like electric vehicles (EVs), battery management systems, and more.
The validation of floating half-bridge and full-bridge architectures commonly used in power conversion, motor drives, and inverters requires the measurement of small differential signals riding on high common-mode voltages. This measurement can be challenging due to voltage source fluctuations relative to the ground, noise interference, and safety concerns.
Isolated differential probes are galvanically isolated and reject common-mode voltages, enabling power electronics engineers to measure floating circuits accurately and safely in high-voltage, noisy environments.
Keysight’s isolated differential probes provide up to 10 billion times greater common-mode rejection than standard differential probes, making them ideal for high-voltage, high-side measurements. With up to 1-GHz bandwidth and a ±2,500 V differential voltage range, these probes enable accurate analysis of fast-switching GaN and SiC devices.
The new voltage probes will be displayed at the Applied Power Electronics Conference (APEC 2025) from March 16th to 20th in Atlanta, Georgia (Booth #829).
Filed Under: Technology News, Testing and Safety