Pickering Interfaces has introduced new PXI (model 40-205) and PXIe (model 42-205) fault insertion modules that use MEMS switching technology to support testing of high-speed two-wire serial interfaces, including the latest MultiGBASE-T1 automotive Ethernet standards.
The modules are designed for hardware-in-the-loop (HIL) simulation and fault testing applications commonly used in the validation of automotive controllers and network components.
As electric vehicle (EV) architectures rely increasingly on high-speed Ethernet communication to link systems such as ADAS, battery management, and motor control, tools like these are used to verify network performance and safety under simulated fault conditions.
By using MEMS technology, the modules provide high bandwidth and fast switching performance, with operating speeds of 50 microseconds and a rated lifespan exceeding three billion operations.
Each module includes four or eight impedance-matched two-wire channels supporting protocols from 10BASE-T1 through 10GBASE-T1. Engineers can simulate open circuits, shorts, and external fault conditions while maintaining signal integrity up to 6 GHz.
While applicable to a range of industries, the modules address growing requirements in EV and automotive electronics for testing the reliability of in-vehicle communication links under a variety of fault scenarios.
Filed Under: Technology News